In scanning electron microscopy (SEM), the working distance is the distance between the specimen and the objective lens. As the working distance decreases, the resolution of the image increases because the electron beam can be focused more sharply on the specimen. A smaller working distance allows for finer details to be resolved due to the smaller interaction volume of the electrons with the sample.
On the other hand, increasing the working distance typically results in a decrease in resolution, as the electron beam becomes less focused. Therefore, the correct statement is that as the working distance decreases, the resolution increases.