Latch-up is a failure mechanism in CMOS (Complementary Metal-Oxide-Semiconductor) circuits where a low-impedance path is inadvertently created between the power supply rails (V\textsubscript{DD} and GND), often leading to excessive current, overheating, and potential circuit destruction.
The cause of latch-up is the presence of
parasitic bipolar transistors that naturally form within the CMOS structure due to the layout of p-type and n-type regions. These parasitic transistors can unintentionally form a
Silicon-Controlled Rectifier (SCR) structure. Once triggered, this structure latches into a conducting state unless power is removed.
Why the other options are incorrect: - (A) High supply voltage may trigger latch-up, but it is not the root cause.
- (C) Gate oxide thickness affects threshold voltage and switching speed, not latch-up.
- (D) Narrow channel widths influence transistor current handling, not the latch-up mechanism.
Thus, the primary cause of latch-up is the presence of
parasitic bipolar transistors.