Question

Match the detector for a scanning electron microscope (SEM) in Column I with the resulting output in Column II. 

• A. P-4; Q-3; R-1; S-2
• B. P-2; Q-4; R-1; S-3
• C. P-3; Q-4; R-2; S-1
• D. P-3; Q-4; R-1; S-2

Hint:

In a scanning electron microscope (SEM), different detectors are used to gather specific types of information. SE detectors are used for surface topography, BSE detectors for compositional contrast, EDS for elemental composition, and EBSD for crystallographic information.

Answer 1

The Correct Option is D

In this question, we need to match the detectors with their corresponding output. Let’s consider the function of each detector and its corresponding output: 
1. SE Detector (P): The Secondary Electron (SE) detector is used for capturing topographic images of the sample's surface. It provides detailed surface features, making it suitable for creating a topographic image. This corresponds to option (3). 
2. BSE Detector (Q): The Backscattered Electron (BSE) detector is sensitive to variations in atomic number contrast in the sample. It helps produce compositional contrast images, revealing differences in composition across the sample. This corresponds to option (4). 
3. EDS Detector (R): The Energy Dispersive Spectroscopy (EDS) detector is used to analyze the elemental composition of the sample by detecting X-rays generated from interactions with electrons. This corresponds to option (1) for elemental composition analysis. 
4. EBSD Detector (S): The Electron Backscatter Diffraction (EBSD) detector is used for crystallographic analysis, especially to observe Kikuchi lines, which are patterns produced due to diffraction of electrons. This corresponds to option (2). 
Thus, the correct matching is: 
\[ {P-3; Q-4; R-1; S-2} \] Therefore, the correct answer is option (D).