Step 1: Understanding Interplanar Spacing
Interplanar spacing refers to the distance between parallel atomic planes in a crystal lattice. It is a critical structural parameter used in materials science and solid-state physics.
Step 2: Why Use a Transmission Electron Microscope (TEM)?
The Transmission Electron Microscope (TEM) can provide high-resolution images at the atomic scale due to:
- Very short electron wavelengths,
- Capability to produce electron diffraction patterns, which can be analyzed using Bragg's Law:
\[
n\lambda = 2d\sin\theta
\]
where \( d \) is the interplanar spacing.
Step 3: Elimination of Other Instruments
- Scanning Electron Microscope (SEM): Provides surface topology, not interplanar distances.
- Spectrophotometer: Measures light absorption, used in chemical analysis.
- Thermogravimetric Analyser (TGA): Measures mass change with temperature; unrelated to crystal structure.
Conclusion: TEM is the appropriate tool for measuring interplanar spacing due to its diffraction and atomic resolution capabilities.