AFM is a widely used high-resolution surface imaging technique.AFM stands for Atomic Force Microscope.It is a type of scanning probe microscopy (SPM), where a sharp probe (tip) is scanned across a surface to map its topography and other physical properties at the nanoscale.
The tip is attached to a cantilever, and the forces between the tip and the sample surface cause the cantilever to deflect.
This deflection is then measured to create a topographical map of the surface.
AFM is used in various fields, including materials science, biology, and nanotechnology, to study surfaces at atomic or molecular resolution.