Question

Match the detector for a scanning electron microscope (SEM) in Column I with the resulting output in Column II. SE: Secondary electrons; BSE: Backscattered electrons; EDS: Energy Dispersive Spectroscopy; EBSD: Electron Backscatter Diffraction \begin{tabular}{|c|c|} \hline Column I & Column II \\ \hline (P) SE Detector & (1) Elemental composition analysis \\ (Q) BSE Detector & (2) Kikuchi lines \\ (R) EDS Detector & (3) Topographic image \\ (S) EBSD Detector & (4) Compositional contrast image \\ \hline \end{tabular}

• A. P-4; Q-3; R-1; S-2
• B. P-2; Q-4; R-1; S-3
• C. P-3; Q-4; R-2; S-1
• D. P-3; Q-4; R-1; S-2

Hint:

Remember: SE → surface topography, BSE → composition (Z-contrast), EDS → elemental analysis, EBSD → Kikuchi patterns (crystallography).

Answer 1

The Correct Option is D

Step 1: SE Detector.
- Secondary electrons (SE) are low-energy electrons emitted from near the surface. - They provide surface-sensitive information. \[ \Rightarrow \text{SE detector gives a topographic image. (P-3)} \]

Step 2: BSE Detector.
- Backscattered electrons (BSE) originate from deeper in the sample and depend strongly on atomic number (Z-contrast). - Regions with higher atomic number appear brighter. \[ \Rightarrow \text{BSE detector gives compositional contrast images. (Q-4)} \]

Step 3: EDS Detector.
- Energy Dispersive X-ray Spectroscopy (EDS) detects characteristic X-rays. - These correspond to the elemental composition of the material. \[ \Rightarrow \text{EDS detector provides elemental composition analysis. (R-1)} \]

Step 4: EBSD Detector.
- Electron Backscatter Diffraction (EBSD) patterns give Kikuchi lines. - These lines are used to determine crystallographic orientation. \[ \Rightarrow \text{EBSD detector shows Kikuchi lines. (S-2)} \]



Step 5: Final Matching.
\[ (P, Q, R, S) = (3, 4, 1, 2) \] Thus, the correct option is: \[ \boxed{\text{(D) P-3; Q-4; R-1; S-2}} \]